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Welcome to the "Technical and Scientific Meeting" website
For now 14 years, the meeting has brought together semiconductor manufacturers, equipment and materials suppliers and research centers on leading-edge topics related to microelectronics in response to the market’s requirements. Moreover, materials, technologies and processes used in the Photovoltaic domain are very often similar. This is why ARCSIS has opened its “Technical and Scientific Meeting” to Photovoltaic actors, as well industrials as research laboratories.
This 15th Meeting will be dedicated to “Characterization Methods for Microelectronics and Photovoltaics”. It will take place on the 28th and 29th of November, 2012, in Ecole Nationale Supérieure des Mines de St-Etienne in Gardanne (Aix en Provence area, southern France).
This conference is organized by ARCSIS, a professional association of microelectronics and photovoltaic actors in the Provence-Alpes-Côte d’Azur region, and, this year, in partnership with “CIM PACA Characterization”. This event is also supported by the Ecole Nationale Supérieure des Mines de Saint-Etienne and SITELESC.
CIM PACA Characterization is a unique platform including the most advanced characterization tools, as well for chemical as for physical or electrical analyses, needed by the microelectronics and photovoltaic actors. All these instruments and the best experts dedicated to these techniques are shared between the regional industrial and academic community.
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